Image analysis – Histogram processing – For setting a threshold
Patent
1986-04-14
1989-03-28
Boudreau, Leo H.
Image analysis
Histogram processing
For setting a threshold
382 22, G06K 948
Patent
active
048171840
ABSTRACT:
An inspection system and method suitable for high speed inspection of articles having bounded surfaces are disclosed. The apparatus processes the image of the item being inspected to provide a first processed image comprising the modulus of the light intensity from the article being inspected, and a second modified image comprising, for each point, the angle of the highest light intensity gradient at that point in the image. The variability of the angle throughout the image is then determined, and the modulus and variability combined such as, by way of example, by point by point multiplication, to provide image data comprising a quantitative evaluation of the image. This data in turn may be combined into a single quantitative measure indicating the desired characteristics of the article being inspected for acceptance and rejection, or otherwise used to determine surface characteristics, locate known or unknown surface anomalies, and/or determine the size, shape, orientation, etc. of an outline or a portion thereof, as desired. The determination and use of the variability of the angle, either alone or in conjunction with the modulus highlights the boundaries of the object for emphasis or de-emphasis, as desired, as angle variability in the region of a boundary is normally very low. Also, other uses of the variability of the angle or other angle dependent information alone or with the modulus avoids the use of matrix rotations for nonoriented objects, again grossly speeding data reduction. Alternative embodiments and methods of data analysis, smoothing, clipping and shaping are disclosed.
REFERENCES:
patent: 3297993 (1967-01-01), Clapper
patent: 3805239 (1974-04-01), Watanabe
patent: 3936800 (1976-02-01), Ejiri et al.
patent: 3973239 (1976-08-01), Kakumoto et al.
patent: 4074231 (1978-02-01), Yajima et al.
patent: 4396903 (1983-08-01), Habicht et al.
patent: 4499598 (1985-02-01), Chittineni
patent: 4545067 (1985-10-01), Juvin et al.
patent: 4553260 (1985-11-01), Belt et al.
patent: 4561104 (1985-12-01), Martin
patent: 4618989 (1986-10-01), Tsukune et al.
patent: 4685143 (1987-08-01), Choate
Sklansky Jack
Thomason Robert L.
Boudreau Leo H.
Vartec Corporation
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