Single-chip microprocessor with built-in self-testing function

Details Single-chip microprocessor with built-in self-testing function Single-chip microprocessor with built-in self-testing function

1995-06-15

1997-08-12

Canney, Vincent P.

Excavating

G06F 1100

Patent

active

056573308

ABSTRACT:
A single-chip microprocessor with a self-testing function for quickly detecting internal errors or defects while mounted to a circuit board without adversely affecting any external electronic devices connected thereto.
A single-chip microprocessor comprising a built-in self-testing function for testing the internal circuitry thereof comprises a test mode signal output means for outputting the test mode signal when in the test mode, which is a mode for self-diagnostic testing of the internal circuitry; and an external output holding means disposed to the external output means for outputting signals from an external output terminal, and holding the output signal status of the external output terminal while the test mode signal is input from the test mode signal output means; and testing the internal circuitry of the single-chip microprocessor while holding the output signal status of the external output terminal.

REFERENCES:
patent: 4433413 (1984-02-01), Fasang
patent: 5119378 (1992-06-01), Welles, II et al.
patent: 5157781 (1992-10-01), Harwood et al.

Affiliated with

Also associated with

Rating

Single-chip microprocessor with built-in self-testing function does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Single-chip microprocessor with built-in self-testing function, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Single-chip microprocessor with built-in self-testing function will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-166433