Temporal trajectory analysis in brain electrical activity mappin

Details Temporal trajectory analysis in brain electrical activity mappin Temporal trajectory analysis in brain electrical activity mappin

1987-04-13

1989-03-28

Jaworski, Francis J.

Surgery

Truss

Pad

A61B 504

Patent

active

048154741

ABSTRACT:
Pathological changes in brain electrical activity over time caused by for example growth of a lesion are detected by producing a brain electrical activity map such as a statistical probability map, and then selecting a template or mask surrounding a suspect area, summating values of the map within the template area to form an aggregate statistical feature, and then plotting the feature over a period of time, e.g. several weeks, to form a trend plot characteristic of brain electrical activity changes.

REFERENCES:
patent: 4254779 (1981-03-01), Miyata et al.
patent: 4279258 (1981-07-01), John
patent: 4421122 (1983-12-01), Duffy
patent: 4579125 (1986-04-01), Strobl et al.
Duffy et al., "Tumor Detection from Topographic Maps of Long Latentcy Evoked Potentials: Spatial Trajectory Analysis and Cross Correlational Analyses", unpublished paper.
Duffy et al., "Brain Electrical Activity Mapping (BEAM): A Method for Extending the Clinical Utility of EEG and Evoked Potential Data", Ann. Neurol., 5:309-321 (1979).
Duffy et al., "Significance Probability Mapping: An Aid in the Topographic Analysis of Brain Electrical Activity", Electroencephalography and Clinical Neurophysiology, 51:455-462 (1981).
Duffy et al., "Topographical Display of Evoked Potentials: Clinical Applications of Brain Electrical Activity Mapping (BEAM)", Anals New York Academy of Sciences, 388:183-196 (1982).

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