Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
Patent
1998-03-25
2000-11-07
Picardat, Kevin M.
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
438409, 438458, 438459, H01L 2130, H01L 2146
Patent
active
061436283
ABSTRACT:
A manufacturing method excellent in controllability, productivity and economics of a high-quality SOI wafer and a wafer manufactured by that method are provided. After wafer bonding, separation is made on an interface of a high porosity layer in a porous region including a low porosity layer and the high porosity layer in a surface formed on a main surface side of a first Si substrate 2 to transfer a non-porous layer onto a second substrate. After separation at the high porosity layer, a residual low porosity thin layer is made non-porous by a smoothing process such as hydrogen annealing without using selective etching.
REFERENCES:
patent: 5492859 (1996-02-01), Sakaguchi et al.
patent: 5854123 (1998-12-01), Sato et al.
patent: 5856229 (1999-01-01), Sakaguchi et al.
C. Harendt, "Silicon on Insulator Material by Wafer Bonding", J. Elect. Mater., vol. 20, No. 3, pp. 267-277 (1991).
C.E. Hunt, "Thinning of Bonded Wafers: Etch-Stop Approaches", Proc. of 1st Intl. Symp. on Semiconductor Wafer Bonding, pp. 165-173 (1991).
A. Uhlir, "Electolytic Shaping of Germanium and Silicon", Bell Sys. Tech. J., vol. 35, pp. 333-347 (1956).
T. Unagami, "Formation Mechanism of Porous Silicon Layer by Anodization in HF Solution", J. Electrochem. Soc., vol. 127, No. 2, pp. 476-483 (1980).
V. Raineri, "Silicon-on-insulator produced by helium implantation and thermal oxidation", Appl. Phys. Lett. vol. 66, No. 26, pp. 3654-3656 (1995).
T. Yonehara, "Epitaxial layer transfer by bond and etch back of porous Si", Appl. Phys. Lett., vol. 64, No. 16, pp. 2108-2110 (1994).
K. Imai, "A New Dielectric Isolation Method Using Porous Silicon", Solid State Elect., vol. 24, pp. 159-164 (1980).
K. Imai, "Crystalline Quality of Silicon Layer Formed by FIPOS Technology", J. Cryst. Grow., vol. 63, pp. 547-553 (1983).
A. VanVeen, "Helium-Induced Porous Layer Formation in Silicon", Mat. Res. Soc. Symp. Proc., vol. 107, pp. 449-454 (1988).
Sakaguchi Kiyofumi
Sato Nobuhiko
Yonehara Takao
Canon Kabushiki Kaisha
Collins D. M.
Picardat Kevin M.
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