Method and apparatus for diagnosing net interconnect faults usin

Details Method and apparatus for diagnosing net interconnect faults usin Method and apparatus for diagnosing net interconnect faults usin

1991-10-30

1994-01-11

Teska, Kevin J.

Excavating

371 572, 371 222, 324527, G06F 1100

Patent

active

052788415

ABSTRACT:
System speed boundary tests are made on nets interconnecting field programmable logic without any external testing equipment or special printed circuit board layout for such a test. Only a single net interconnecting all field programmable logic in a ring is employed. The tests are made for opens and shorts and localize faults to a particular net. Nets interconnecting field programmable logic are tested utilizing the information stored in the circuit design file and the reprogrammability of the field programmable logic to construct a circuit that is then implemented in the field programmable logic and tests all interconnecting nets.

REFERENCES:
patent: 4009437 (1977-02-01), Lacher
patent: 4395767 (1983-07-01), Van Brunt et al.
patent: 4625311 (1986-11-01), Fitzpatrick et al.
patent: 4651088 (1987-03-01), Sawada
patent: 4656632 (1987-04-01), Jackson
patent: 4991174 (1991-02-01), Mori et al.
IBM Technical Disclosure Bulletin, vol. 21, No. 2, Jul. 1978, "Shorts Diagnosis Using Logic Test Data", pp. 503-508, Babiel et al.
IBM J. Res. Develop., vol. 34, No. 2/3, Mar./May 1990, "Boundary Scan Design Principles for Efficient LSSD ASIC Testing", Bassett et al.
1988 International Test Conference, paper 7.1, "Testing and Diagnosis of Interconnects using Boundary Scan Architecture", Hassan et al.
1988 International Test Conference, paper 7.3, "Design for Testability for Wafer-Scale Integration Interconnect Systems Design & Test Methodology", M. Gruetzner.
1987 International Test Conference, paper 30.2, "Testing a Board with Boundary Scan", Dirk van de Lagemaat et al.
1987 International Test Conference, paper 2.2, "Interconnect Testing with Boundary Scan", Wagner.
1987 International Test Conference, paper 30.1, "Boundary-Scan: A Framework for Structured Design-For-Test", Maunder et al.

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