Mass spectrometer

Details Mass spectrometer Mass spectrometer

1982-03-19

1984-07-03

Howell, Janice A.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250299, B01D 5944, H01J 4930

Patent

active

044581505

ABSTRACT:
A mass spectrometer comprises a source for generating ions, a means for separating the ions according to mass, and means for detecting the separated ions. The mass spectrometer is characterized by that means for separating ions comprises a sector type homogenous magnetic field, and that the magnetic field has a deflection angle ranging from 110 to 135 degrees, and incident and exit angles ranging from 40 to 60 degrees.

REFERENCES:
patent: 3500042 (1970-03-01), Castaing et al.
patent: 3967116 (1976-06-01), Geerk
Leporskii, B. B. et al., "Stigmatic Mass Spectrometer Analyzer with Second-Order Focusing", Sov. Phys. Tech. Phys., vol. 18, No. 4, (Oct. 1973), pp. 552-553.

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