Device for measuring the thickness of metal film on the inner su

Details Device for measuring the thickness of metal film on the inner su Device for measuring the thickness of metal film on the inner su

1997-02-20

1998-09-22

Raevis, Robert

Measuring and testing

Probe or probe mounting

G01N 2300

Patent

active

058117016

ABSTRACT:
A device for measuring the thickness of a metal film on the inner surface of a panel includes a frame located over a panel to be transferred, a guide rail pivotably combined with the frame at one end such that an angle of installation can be adjusted, a dolly installed on the guide rail, for moving back and forth along the guide rail, tracking means combined to the dolly, for transferring the dolly at the speed the panel moves by selectively contacting the side surface of the moving panel, measuring sensors installed at the dolly so as to ascend to and descend from the dolly, for measuring the thickness of a metal film by contacting the panel being transferred, and elevating means for lifting and lowering the measuring sensors with respect to the panel. The device can reduce man hours according to the measurement of the thickness of the metal film on the inner surface of the panel.

REFERENCES:
patent: 4271699 (1981-06-01), Williamson
patent: 4383172 (1983-05-01), Holler et al.
patent: 4682105 (1987-07-01), Thorn

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