Apparatus for improving mechanical strength of the neck section

Single-crystal – oriented-crystal – and epitaxy growth processes; – Apparatus – For crystallization from liquid or supercritical state

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117200, 117217, 117222, 117900, C30B 3500

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active

058273670

ABSTRACT:
An apparatus and method for growing large diameter silicon crystals using the Czochralski (Cz) method, wherein the neck section of the crystal is significantly strengthened to eliminate the risk of breakage in the neck section, by providing a heat shield assembly which is located adjacent to the neck section and ascends in conjunction therewith to force the cooling gas directly onto the neck section of the silicon ingot.

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patent: 5573591 (1996-11-01), Ikezawa et al.
Minimization of thermoelastic stresses in Czochralski grown silicon: application of the integrated system model; D.E. Bornside, T.A. Kinney and R.A. Brown; Journal of Crystal Growth 108 (1991) 779-805; Department of Chemical Engineering and Materials Processing Center, Massachusetts Institute of Technology, Aug. 23, 1990.

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