Prescaler IC testing method and test probe card

Details Prescaler IC testing method and test probe card Prescaler IC testing method and test probe card

1995-12-28

1997-02-18

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

395800, 324 725, 324 731, G06F 738, G01R 104, G01R 3128

Patent

active

056044470

ABSTRACT:
A probe card includes an oscillator generating an AC signal, an averaged value detecting circuit receiving a signal outputted from a prescaler IC, for generating an averaged DC signal, and a plurality of switches for changing a flow of a signal among the IC tester, the prescaler IC, the oscillator and the averaged value detecting circuit. The switches is so controlled that the AC signal is supplied to the prescaler IC, and the signal outputted from the prescaler IC is supplied to the averaged value detecting circuit and converted to the averaged DC signal, whereby a non-defective/defective of the AC function of the prescaler IC is discriminated on the basis of the obtained averaged DC signal. The switches are also so controlled that a DC test signal is supplied from the IC tester to the prescaler IC and a DC output signal outputted from the prescaler IC is supplied to the IC tester. Thus, both an AC function test and a DC function test can be carried out on the prescaler IC in the form of a wafer by transferring only DC signals between the IC tester and the probe card.

REFERENCES:
patent: 4222095 (1980-09-01), Stein
patent: 5070297 (1991-12-01), Kwon et al.
patent: 5202626 (1993-04-01), Pham et al.
patent: 5448747 (1995-10-01), Garverick et al.

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