Dimension measuring apparatus

Geometrical instruments – Area integrators – Electrical

Patent

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Details

33 1M, 33288, 33169C, G01B 700, G01B 731

Patent

active

044779780

ABSTRACT:
A dimension measuring apparatus, for automatically measuring a dimension of a workpiece as the workpiece is on a production line, has a probe with a tapered end for insertion into a hole of the workpiece to be measured. The probe is supported by a second movable base provided on a first movable base. The first movable base is slidably provided on a frame member in one direction in a planar level and the second movable base is slidably provided on a grooved upper surface of the first movable base in another direction perpendicular to the one direction in the planar level. The movement value of the probe is detected by means of detecting the movement values of the first and second movable bases through potentiometers.

REFERENCES:
patent: 2747535 (1956-05-01), Curry
patent: 3241243 (1966-03-01), Speer
patent: 3455025 (1969-07-01), Heyroth
patent: 3888012 (1975-06-01), Droz

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