Test pattern fault equivalence

Details Test pattern fault equivalence Test pattern fault equivalence

1992-10-28

1995-04-25

Voeltz, Emanuel T.

Excavating

371 26, 371 27, 324 731, G01R 3128

Patent

active

054105480

ABSTRACT:
A method for determining test pattern fault equivalence. The method comprises selecting a bridging fault (16) from a digital circuit, then determining a stuck-at fault (17) which guarantees detection of the bridging fault. Generation of a test vector (18) which detects the stuck-at fault. Simulating the test vector (19) to find all bridging faults that are detected by the test vector, and repeating the above steps until the desired percentage of detectable bridging faults are examined.

REFERENCES:
patent: 4228537 (1980-10-01), Henckels et al.
patent: 4763289 (1988-08-01), Brazilai et al.
patent: 5084876 (1992-01-01), Welham et al.
Acken et al. `Fault model evolution for diagnosis:accuracy vs precision` May 1992 pp. 13.4.1-13.4.4
Millman et al. `An accurate fault test pattern generator` Oct. 1991 pp. 411-418.

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