Semiconductor device testing apparatus

Details Semiconductor device testing apparatus Semiconductor device testing apparatus

1992-07-07

1995-04-25

Nguyen, Vinh

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

054102618

ABSTRACT:
A testing apparatus which assures that a constant acceleration test and an AC continuous operation test can be simultaneously conducted on semiconductor devices to be tested. The testing apparatus includes a rotatable turntable with semiconductor devices to be tested mounted thereon, rotary terminals electrically connected to connection pins of the semiconductor devices mounted on the turntable and adapted to rotate together with the turntable, and stationary terminals adapted to intermittently or continuously slidably contact the rotary terminals while the turntable is rotated.

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Patent Abstract of Japan, vol. 6, No. 170 (E-128) 3 Sep. 1982 and JP-A-57 087 148 (NEC) 31 May 1982, Abstract.
Method 3001.1-4007, MIL-STD-883C Aug. 25, 1983 Drive Source, Dynamic.
JIS 7022 Japan 1979 (Full Japanese text and relevant portions translated into English).

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