Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-06-28
1997-07-22
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324760, 324754, G01R 3102
Patent
active
056507321
ABSTRACT:
A semiconductor device test system for efficiently testing many types of devices and for reducing the amount of floor space needed. The test system has a test board having a plurality of sockets for receiving semiconductor devices. A semiconductor device insertion and extraction station removes the devices from a tray and inserts them into the sockets of the test board and extracts the devices from the sockets to mount them on the tray. A test chamber has a temperature setting section for setting the test board to a test environmental temperature and a test-performing section for supporting the test board so that electrode terminals of the sockets are exposed. A tester head is simultaneously connected to the electrode terminals of the sockets of the test board. A head moving section connects the tester head to the electrode terminals of the sockets of the test board. A tester is connected to the tester head to test electrical characteristics of the semiconductor devices.
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Khosravi Kourosh Cyrus
Mitsubishi Denki & Kabushiki Kaisha
Wieder Kenneth A.
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