Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent
1982-06-21
1986-02-18
Clawson, Jr., Joseph E.
Electrical transmission or interconnection systems
Nonlinear reactor systems
Parametrons
307584, 357 234, 357 238, 357 2314, 357 39, 357 41, 357 43, 357 86, H03K 17687
Patent
active
045715130
ABSTRACT:
Lateral FET Structure is disclosed for bidirectional power switching, including AC application. A pair of notches, each with a gate electrode, extend downwardly from a top major surface to separate left and right source regions and left and right channel regions, and direct the drift region current path between the channels around the bottoms of the notches. In the OFF state, each gate electrode shields its respective notch edge drift region portion from the electric field gradient from the other gate electrode, to prevent depletion along the notches and unwanted inducement of conduction channels, thus affording higher OFF state voltage blocking capability. High density, high voltage plural FET structure is disclosed.
REFERENCES:
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J. Tihanyi, "Funct. Integ. of Power MOS and Bipolar Devices," Proc. 1980 IEEE IEDM, Dec. 1980, pp. 75-78.
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"Optimum Doping Profile for Minimum Ohmic Resistance and High Breakdown Voltage", C. Hu; IEEE Transactions Electron Devices; vol. ED-26; 1970; pp. 243-244.
P. Ou-Yang, "Double Ion Implanted V-MOS Tech," IEEE J. of S.-S. CKTS., vol. SC-12, #1, Feb. 1977, pp. 3-10.
Benjamin James A.
Lade Robert W.
Schutten Herman P.
Clawson Jr. Joseph E.
Eaton Corporation
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