Feedback circuit for a semiconductor active element sensor

Electrical transmission or interconnection systems – Personnel safety or limit control features – Interlock

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307304, 307119, 357 26, 328 5, 340365C, 340562, 73777, 73780, H03K 3353, H03K 5153, H01L 2720, G01L 122

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active

046330992

ABSTRACT:
The drain voltage of an IGFET having a channel responsive to the change in physical quantity to be measured is negatively fed back to the gate terminal of the IGFET. The negative feedback loop includes series connection of a first amplifier having an amplification factor larger than unity and a second amplifier having an amplification factor smaller than unity. The interconnection point between the first and the second amplifiers is connected to the output terminal. There is provided a stable, highly sensitive and highly reliable semiconductor sensor.

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Dorey, "A High Sensitivity Semiconductor Strain Sensitive Circuit", Solid State Electronics, vol. 18, pp. 295-299, Jun. 7, 1983.
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Fink et al, Electronics Engineers' Handbook, pp. 16-15 through 16-18, 1982.

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