Standing wave interferometer for measuring optical path differen

Details Standing wave interferometer for measuring optical path differen Standing wave interferometer for measuring optical path differen

1983-02-28

1986-02-18

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01B 902

Patent

active

045710830

ABSTRACT:
The invention relates to a standing wave interferometer for measuring optical path differences in which a standing wave is produced between a monochromatic light source and a reflector. The displacement of the bulges and nodal points of the standing wave due to displacement of the reflector is sampled by a sampling normal inserted into the standing wave and having two photodetecting layers at a mutual space of k.multidot..lambda./8, k being any desired odd integer. The sampling signals are fed into an electronic evaluation unit where these are processed. The measuring object, when having a well-reflecting surface can be the reflector itself, without the necessity of adjusting the same accurately to the incident light beam.

REFERENCES:
patent: 4443107 (1984-04-01), Alexander et al.

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