Method for simultaneous determination of thickness and electroch

Details Method for simultaneous determination of thickness and electroch Method for simultaneous determination of thickness and electroch

1980-06-16

1982-01-12

Kaplan, G. L.

Chemistry: electrical and wave energy

Processes and products

2041292, 2041296, 204195R, 204224R, 324 71R, G01N 2702, G01N 2726

Patent

active

043103898

ABSTRACT:
A method and apparatus for simultaneously measuring the thickness of individual layers of a multilayer plated deposit, the electrochemical potential difference between the layers, and the relative polarity of the layers, is disclosed.

REFERENCES:
patent: 2457234 (1948-12-01), Herbert et al.
patent: 4179349 (1979-12-01), Park

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