Apparatus and methods for the shunt calibration of semiconductor

Measuring and testing – Instrument proving or calibrating – Volume of flow – speed of flow – volume rate of flow – or mass...

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73766, G01L 2500

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active

044148372

ABSTRACT:
There is disclosed an apparatus and a technique for shunt calibration of a Wheatstone bridge array independent of temperature. The structure involves a side completion half bridge array which has two temperature sensitive resistors as semiconductor strain gages forming one arm of the bridge and two temperature insensitive resistors forming the other arm of the bridge. An input voltage is applied to two opposite terminals of the bridge via equal span resistors and an output is taken between the common terminals of each of the bridge arms. A calibration resistor is positioned to shunt a span resistor and a temperature insensitive resistor to provide a calibrated output voltage of a magnitude independent of temperature.

REFERENCES:
patent: 3046782 (1962-07-01), Laimins
patent: 3074175 (1963-01-01), Ludlan
patent: 3130578 (1964-04-01), Ames, Jr.
patent: 3490272 (1970-01-01), Russell
patent: 4172389 (1979-10-01), Branch
patent: 4333349 (1982-06-01), Mallon et al.

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