Apparatus for imaging liquid and dielectric materials with scann

Measuring and testing – Surface and cutting edge testing – Roughness

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250306, G01B 734

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active

057447047

ABSTRACT:
The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.

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