Sampling wave-form digitizer for dynamic testing of high speed d

Details Sampling wave-form digitizer for dynamic testing of high speed d Sampling wave-form digitizer for dynamic testing of high speed d

1985-11-27

1989-02-21

Gruber, Felix D.

Boots, shoes, and leggings

324 77A, 364580, G06F 1531, G01R 2316

Patent

active

048071471

ABSTRACT:
A sampling digitizer system which may be expanded for the dynamic testing of high speed data conversion components is provided. The sampling waveform digitizer system comprises a sampling comparator for comparing a sampled input signal with a first signal. An integrator coupled to the comparator provides an output signal from the integrator and becomes the first signal. An analog to digital converter provides the digital representation of the analog waveform. A controllable delay is provided for selecting a period of time for sampling the input signal by the comparator. A control device is provided for controlling the time the comparator samples the input signal. These combination of system features allow the digitizer to receive high speed analog waveforms and convert them to an accurate digital representation of the previously described high speed analog waveform.

REFERENCES:
patent: 2803702 (1957-08-01), Ville et al.
patent: 3402258 (1968-09-01), Lerner
patent: 3668559 (1972-06-01), Williams et al.
patent: 3855555 (1974-12-01), Burkhard et al.
patent: 4208740 (1980-06-01), Yin et al.
patent: 4295217 (1981-10-01), Fennel, Jr. et al.
patent: 4328588 (1982-05-01), Smithson
patent: 4375329 (1983-03-01), Park
patent: 4433311 (1984-02-01), Noguchi et al.
patent: 4510571 (1985-04-01), Dagostino et al.

Affiliated with

Also associated with

Rating

Sampling wave-form digitizer for dynamic testing of high speed d does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sampling wave-form digitizer for dynamic testing of high speed d, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sampling wave-form digitizer for dynamic testing of high speed d will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1527775