Patent
1987-05-13
1989-02-21
Carroll, J.
357 231, H01L 2348, H01L 2978
Patent
active
048070157
ABSTRACT:
A semiconductor device which is provided with an electrode and/or an interconnection made of a refractory metal film containing silicon oxide is disclosed. A refractory metal film containing silicon oxide has high capability of blocking penetration of ions and is suitable for being employed as a mask for forming a source and a drain of an MOS transistor by ion-implantation and as it has strong adhesion with an insulation film improves reliability of a semiconductor device.
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Yamoto et al, Semiconductor Device Transistor Meeting on Japanese Electrocommunication Society, SSBD 89-98, pp. 39-45.
C. Hu et al, "A Resistive-gated IGFET Tetrode," IEEE Transactions on Electron Devices, vol. ED-18 (1971) pp. 418-425.
Hara Nobuo
Iwata Seiichi
Kobayashi Nobuyoshi
Yamamoto Naoki
Carroll J.
Hitachi , Ltd.
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