Micro-displacement measuring apparatus using a semiconductor las

Details Micro-displacement measuring apparatus using a semiconductor las Micro-displacement measuring apparatus using a semiconductor las

1986-02-26

1989-02-21

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356 4, 356373, G01B 1100

Patent

active

048067784

ABSTRACT:
A micro-displacement measuring apparatus using a semiconductor laser, comprises a compound resonator system containing the semiconductor laser, and a light detector receiving a light from said semiconductor laser. The compound resonator system is constructed such that a light from the semiconductor laser irradiates an object to be measured and the reflected light therefrom returns to the semiconductor laser, wherein the relationship between the reflectivity R.sub.f at the front facet of the semiconductor laser from which a laser light irradiates the object, and the reflectivity Rr at the rear facet of the semiconductor laser which is opposite the front facet is as follows: 0.1<R.sub.f Rr<1.

REFERENCES:
patent: 3409370 (1968-11-01), King et al.
patent: 4655597 (1987-04-01), Yamamoto et al.
Pankove et al., "High Precision Distance Measuring Laser", RCA Technical Note #918, Oct. 25, 1972.
Dandrige et al., "Diode Laser Sensor", Electronics Letters, vol. 16, No. 25, Dec. 4, 80.

Affiliated with

Also associated with

Rating

Micro-displacement measuring apparatus using a semiconductor las does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Micro-displacement measuring apparatus using a semiconductor las, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Micro-displacement measuring apparatus using a semiconductor las will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1524087