Deep channel MOS transistor

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 91, 307238, 307304, H01L 2978

Patent

active

040005046

ABSTRACT:
A semiconductor charge storage and detection device is provided in which an ion implanted conductive channel is buried between source and drain regions in the bulk of a semiconductor substrate. A charge storage region extends between the channel and the surface of the semiconductor device. The charge storage region is isolated from the semiconductor substrate and may be depleted of charge or enabled to store charge depending upon the electrical potential applied to a gate electrode at the surface of the device. The amount of charge stored may be detected by sensing the conductance of the buried channel. The device may be variously configured, e.g. as a non-destructive readable photosensor or as a memory cell.

REFERENCES:
patent: 3283221 (1966-11-01), Heiman
patent: 3631308 (1971-12-01), Krolikowski
patent: 3676715 (1972-07-01), Brojdo
patent: 3814992 (1974-06-01), Kump et al.
patent: 3906296 (1975-09-01), Maserjian et al.
patent: 3916268 (1975-10-01), Engeler et al.
D. Kahng et al., "A Fl. Gate and its Appl. to Mem. DeV.sub.2," Bell. Tel. Tech. J., vol. 46, Aug. 1967, pp. 1288-1295.
M. Lenzlinger et al., "Fowler-Nordheim Tunneling into Thermally Grown SiO.sub.2," J. Appl. Phys., vol. 40, No. 1, Jan. 1969, pp. 278-283.
R. Oakley, "MNOS: A New Non-Volatile Store," Compon. Technol. (G.B.), vol. 4, No. 5, Oct. 1970, pp. 17-21.
B. Agusta et al., "Nonvolatile Imaging Devices," IBM Tech. Discl. Bull., vol. 15, No. 9, Feb. 1973, p. 2821.
C. Bosselaar, "Charge Injection into SiO.sub.2 from Rev. Biased Jens.," S.S. Electronics, vol. 16, May 1973, pp. 648-651.
J. Verwey et al., "ATMOS-An Elect. Reprog. Read-Only Mem. Device," IEEE Trans. on Elec. Dev., vol. ED-21, No. 10, Oct. 1974, pp. 631-636.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Deep channel MOS transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Deep channel MOS transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deep channel MOS transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-151501

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.