Method and apparatus for a pin-configurable integrated circuit t

Details Method and apparatus for a pin-configurable integrated circuit t Method and apparatus for a pin-configurable integrated circuit t

1999-01-08

1999-09-14

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324755, G01R 104

Patent

active

059528397

ABSTRACT:
Apparatus and methods are disclosed that provide a high bandwidth configurable tester board for use with automated testing equipment for testing integrated circuits. Power, ground and ATE signal connections are made by selected conductive pins making electrical contact between the tester board and the handler board. The tester board is configurable by physically selecting which pins make electrical connections between the tester board and the handler board.

REFERENCES:
patent: 4771234 (1988-09-01), Cook et al.
patent: 5380212 (1995-01-01), Smeenge, Jr. et al.
patent: 5399982 (1995-03-01), Driller et al.
patent: 5493230 (1996-02-01), Swart et al.

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