Method and an apparatus for simultaneous measurement of both tem

Details Method and an apparatus for simultaneous measurement of both tem Method and an apparatus for simultaneous measurement of both tem

1978-04-04

1979-10-30

Swisher, S. Clement

Measuring and testing

Gas analysis

Moisture content or vapor pressure

G01J 510, G01K 1306

Patent

active

041723830

ABSTRACT:
A black body furnace and a radiation thermometer are spaced from each other in the direction of the surface of a heated material the temperature and emissivity of which is to be measured so as to be in a specular, or mirror-like, symmetry to a line normal to the heated material and the wavelength band of the detector of the radiation thermometer is selected such that the surface of the material shows specular, or mirror-like, reflection characteristics. The radiation energy emitted from the black body furnace is changed and the outputs of the radiation thermometer responding to the change are processed whereby the emissivity and surface temperature of the material are obtained. The use of this invention makes it possible to measure accurately the temperature of the material without any disturbance, even if the emissivity of the material is changed in the course of the measurement.

REFERENCES:
patent: 3057200 (1962-10-01), Wood
patent: 3433052 (1969-03-01), Maley
patent: 3796099 (1974-03-01), Shimotsuma

Affiliated with

Also associated with

Rating

Method and an apparatus for simultaneous measurement of both tem does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and an apparatus for simultaneous measurement of both tem, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and an apparatus for simultaneous measurement of both tem will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-15122