Thermal measuring and testing – Leak or flaw detection
Patent
1992-09-09
1994-03-08
Cuchlinski, Jr., William A.
Thermal measuring and testing
Leak or flaw detection
374124, 374129, 250330, 348164, G01N 2572
Patent
active
052921956
ABSTRACT:
In a nondestructive thermographic evaluation technique, a selected amount of energy is applied to a first object having a known surface structure. An image of the first object is formed within the dynamic limits of an imaging device which preferably includes a white bar. The image is stored on a recording device and enhanced using an image processor. The selected amount of energy is then applied to a second object which is imaged by the imaging device, and the image of the second object is also enhanced. The images of the first and second objects are then compared to determine whether there are any differences in the surface structure of the two objects.
REFERENCES:
patent: 4083223 (1978-04-01), Hashimoto et al.
patent: 4647220 (1987-03-01), Adams et al.
patent: 4733079 (1988-03-01), Adams et al.
patent: 4751571 (1988-06-01), Lillquist
patent: 4768158 (1988-08-01), Osanai
patent: 4795906 (1989-01-01), Adams et al.
patent: 4854724 (1989-08-01), Adams et al.
patent: 4866276 (1989-09-01), Leavens et al.
patent: 4872762 (1989-10-01), Koshihara et al.
patent: 4983836 (1991-01-01), Matoba et al.
patent: 5032727 (1991-07-01), Cox, Jr. et al.
patent: 5041726 (1991-08-01), Chang et al.
patent: 5069005 (1991-12-01), Hovland et al.
patent: 5111048 (1992-05-01), Devitt et al.
Bennett G. Bradley
Cuchlinski Jr. William A.
Martin Marietta Corporation
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