Semiconductor laser scanning system

Details Semiconductor laser scanning system Semiconductor laser scanning system

1982-08-23

1984-07-17

Corbin, John K.

G02B 2717

Patent

active

044602405

ABSTRACT:
An optical scanning system provides an intensity-modulated, illuminated spot for contour measurements using phase detection. Two semiconductor lasers, which are thermally coupled but are electrically isolated, transmit light beams which are translated and separately collimated by the optics of the system. The collimated beams are then combined on adjacent reflecting facets of a rotating polyhedron to form a narrow beam which illuminates a small spot at relatively high intensity. The beam scans across the target surface over an angle of 120 degrees.

REFERENCES:
patent: 2779819 (1957-01-01), Graham et al.
patent: 3646568 (1972-02-01), Woywood
patent: 4070089 (1978-01-01), Grafton
Tibbetts, R. E., & Wilczynski, J. S., "Scanning Lens," IBM Technical Disclosure Bulletin, vol. 14, No. 11, Apr., 1972, pp. 3262-3263.

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