Tester for LSI devices and memory devices

Details Tester for LSI devices and memory devices Tester for LSI devices and memory devices

1981-10-09

1984-05-22

Atkinson, Charles E.

Excavating

324 73R, 371 21, 371 27, G01R 3128

Patent

active

044505604

ABSTRACT:
A single tester tests both LSI and memory devices by storing test signals and standards for the pins of LSI devices in a storage element, providing test signals and standards for the data pins of memory devices from a generator, and selectably routing the test signals and standards from the storage element for LSI testing and from the generator for memory testing; format and timing information for each test signal and standard (for LSI testing) or for groups of test signals and standards (for memory testing) is stored in a second storage element and addresses corresponding to each test signal and standard (for LSI testing) or to each group of test signals and standards (for memory testing) and selectably provided to the second storage element.

REFERENCES:
patent: 2905930 (1959-09-01), Golden
patent: 3235849 (1966-02-01), Klein
patent: 3311890 (1967-03-01), Waaben
patent: 3474421 (1969-10-01), Stein
patent: 3659088 (1972-04-01), Boisvert, Jr.
patent: 3739349 (1973-06-01), Burdette
patent: 3781829 (1973-12-01), Singh
patent: 3805243 (1974-04-01), Boisvert
patent: 3832535 (1974-08-01), De Vito
patent: 3873817 (1975-03-01), Barnard
patent: 3916306 (1975-10-01), Patti
patent: 4099259 (1978-07-01), Parsons et al.
patent: 4137562 (1979-01-01), Boeck et al.
patent: 4195343 (1980-03-01), Joyce
patent: 4195779 (1980-07-01), Benton et al.
patent: 4216539 (1980-08-01), Raymond
patent: 4249173 (1981-02-01), Lockhart
patent: 4287594 (1981-09-01), Shirasaka
patent: 4380068 (1983-04-01), de Couasnon

Affiliated with

Also associated with

Rating

Tester for LSI devices and memory devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Tester for LSI devices and memory devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tester for LSI devices and memory devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1482108