Measuring and testing – Fluid pressure gauge – Diaphragm
Patent
1992-09-24
1994-03-08
Chilcot, Jr., Richard E.
Measuring and testing
Fluid pressure gauge
Diaphragm
73721, 73708, 73726, 73756, 338 4, G01L 906
Patent
active
052917886
ABSTRACT:
A semiconductor pressure sensor according to the invention comprises a first semiconductor substrate and a second semiconductor substrate, disposed around the first substrate, so that signals obtained by the semiconductor pressure sensor under static or differential pressure conditions can be properly corrected and both static and differential pressures can be detected accurately and reliably measured on the same semiconductor substrates. Another object of the invention is provide a semiconductor pressure sensor which utilizes a single substrate with an aperture, which acts as a pressure overload stop mechanism, and which does not suffer from any effects of diaphragm deformation as a result of possible pressure overload.
REFERENCES:
patent: 4528855 (1985-07-01), Singh
patent: 5107710 (1992-04-01), Huck et al.
Fukai Wataru
Oohata Satoshi
Yonemoto Satoshi
Chilcot Jr. Richard E.
Kabushiki Kaisha Toshiba
Moller Richard
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