Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-10-09
1992-03-17
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
209522, 324690, G01R 3500
Patent
active
050972162
ABSTRACT:
Apparatus for inspecting the thickness of a container wall, such as a glass or plastic container wall including a plurality of elongated sensors disposed in a linear array in spaced end to end relationship. The containers are urged into intimate contact with the sensor elements and are rotated thereover. The containers are moved from sensing element to sensing element with each element inspecting a portion of the circumference. Oscillators convert the change in capacitance to a corresponding voltage which, in turn, in a processor is converted to an actual thickness reading which is compared with desired predetermined thickness levels. By segmenting the sensors in this manner, a plurality of containers may be inspected simultaneously with a processor combining the individual segments of sensor readings so as to reconstruct the complete thickness evaluation of the container. A corresponding method is provided.
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Dimmick, Sr. Henry M.
Layton William L.
Stivison Lloyd B.
Zanella, Sr. Mark F.
AGR International, Inc.
Regan Maura K.
Silverman Arnold B.
Wieder Kenneth A.
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