Apparatus for testing an integrated circuit device

Details Apparatus for testing an integrated circuit device Apparatus for testing an integrated circuit device

1988-06-22

1990-01-09

Eisenzopf, Reinhard J.

Excavating

371 251, G01R 3100

Patent

active

048930725

ABSTRACT:
An IC tester for testing an IC device having clocked circuits operative to process a signal under control of a clock signal with a time delay shift comprises a generator for generating a test signal to be supplied to the IC device under control of a timing signal having a repetition period equal to the period of the clock signal, a generator for generating an expected signal to be hopefully delivered from the IC device in response to the test signal, a shifting circuit for effecting a time delay shift of the expected signal equal to the time delay shift in the clocked circuits in the integrated circuit device, and a comparator for comparing the output signal of the IC device responsive to the test signal with the expected signal delivered through the shifting circuit to thereby determine performance characteristics of the IC device.

REFERENCES:
patent: 4430735 (1984-02-01), Catiller
patent: 4584683 (1986-04-01), Shimizu

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