Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1998-03-11
2000-01-11
Ballato, Josie
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324 731, G01R 3102
Patent
active
060140356
ABSTRACT:
The present invention is directed to a new test system by which an electric test and an optical test for a liquid crystal display device, such as a liquid crystal panel, can be performed at the same time and under the same conditions, and to enhancing the test accuracy and the test efficiency.
More particularly, the present invention is directed to a test system for a liquid crystal display device comprising: an optical controller 1 for supplying a control signal to a gate line and a data line of a liquid crystal panel 6 that is to be examined; an electric charge measurement unit 2 for measuring pixel capacitances of pixels in one frame of the liquid crystal panel 6; a test switching unit 3 for, in response to a test start signal instructing that the electric test be started, connecting the data line of the liquid crystal panel 6, which has connected to the optical controller 1, to the electric charge measurement unit 2 during a period equivalent to one frame; an image processor 4 for performing image processing for the electric charge value measured by the electric charge measurement unit 2; and a display unit 5 for displaying the resultant image.
REFERENCES:
patent: 5576730 (1996-11-01), Shimada
patent: 5694053 (1997-12-01), Smith
patent: 5696550 (1997-12-01), Aoki
Ballato Josie
International Business Machines - Corporation
Sbrollini Jay P.
Solis Jose M.
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