Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1998-01-21
1999-11-09
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1104
Patent
active
059824956
ABSTRACT:
The present invention provides a method and apparatus for automatically counting objects, e.g., chips, that are arranged in a linear object sequence. The object sequence has a length that is proportional to the number of objects in the object sequence. In one embodiment of the counting method, the length of the object sequence is measured. The number of objects in the sequence are then determined from the measured length of the object sequence and the known length of a chip. In one embodiment of a counting apparatus, the apparatus has a scan station, a distance sensor, and a processor. The scan station has a scan zone that receives a plurality of object sequences. The distance sensor is operably aligned with the scan zone for measuring the length of each object sequence. The processor is communicatively connected to the distance sensor to determine and calculate the number of objects within the plurality of object sequences from the measured length of each object sequence.
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Font Frank G.
Micron Electronics Inc.
Nguyen Tu T.
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