Thermal measuring and testing – Emissivity determination
Patent
1996-04-10
1998-03-10
Bennett, G. Bradley
Thermal measuring and testing
Emissivity determination
374126, G01J 510, G01N 2500
Patent
active
057270171
ABSTRACT:
A method and apparatus for measuring the emission coefficient of a semiconductor material for light of wavelength .lambda. having photon energy less than the semiconductor bandgap energy is introduced. The reflection coefficient for the light of wavelength .lambda. is measured while the semiconductor material is being irradiated with sufficient light having photon energy greater than the bandgap energy that the semiconductor material transmits little light of wavelength .lambda., and the emission coefficient is calculated from the measured reflection coefficient. The temperature of the semiconductor material can be calculated from the emission coefficient and the measured intensity of the thermally emitted radiation of wavelength .lambda..
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Gschwandtner Alexander
Lerch Wilfried
Maurer Michael
AST Electronik, GmbH
Bennett G. Bradley
Hodgson Rodney T.
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