Process for dynamic composition and test cycles reduction

Details Process for dynamic composition and test cycles reduction Process for dynamic composition and test cycles reduction

1995-09-18

1998-03-10

Beausoliel, Jr., Robert W.

Excavating

371 27, G01R 3128

Patent

active

057269963

ABSTRACT:
A new dynamic process for test sequence compaction and test cycle reduction that identifies bottlenecks that prevent vector compaction and test cycle reduction for test sequences generated initially and generates subsequent test sequences with the aim of eliminating bottlenecks of the initially generated test sequences. To apply the process to sequential circuits, a sliding anchor frame technique is used that involves specifying the unspecified bits of a partially specified test sequence to detect other faults.

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