Method and apparatus for testing an integrated circuit including

Details Method and apparatus for testing an integrated circuit including Method and apparatus for testing an integrated circuit including

1987-10-02

1989-11-21

Lall, Parshotam S.

Boots, shoes, and leggings

3642328, 324 73R, 371 211, G11C 2900, G01R 3128, G06F 1126, G06F 100

Patent

active

048826731

ABSTRACT:
An integrated electronic circuit is provided comprising: a microprocessor for executing instructions; an instruction cache for storing instructions for execution by the microprocessor, the instruction cache being coupled to the microprocessor for transfer of respective stored instructions to the microprocessor; and circuitry for exchanging respective byte positions of at least two bytes of a respective instruction stored by the instruction cache.

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patent: 4638423 (1987-01-01), Ballard
patent: 4737933 (1988-04-01), Chiang et al.
patent: 4761755 (1988-08-01), Ardini, Jr. et al.

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