Method for fabricating an insulated-gate FET having a narrow cha

Fishing – trapping – and vermin destroying

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437 29, 437 45, 437953, 148DIG82, H01L 2182

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047374713

ABSTRACT:
A method of fabricating a narrow channel width IG-FET which includes compensating for impurities diffused into the channel region from the channel stopper, thereby providing the IG-FET with a threshold providing the IG-FET with a threshold voltage establishing at a level substantially the same as that of conventional wider channel width IG-FETs. According to the present invention, impurities having a conductivity type opposite to that of the impurities diffused from the channel stopper are selectively implanted in at least the channel region of the narrow channel width IG-FET, to compensate the diffused impurities. Impurities for channel doping are then implanted to adjust the threshold voltage.

REFERENCES:
patent: 4108686 (1978-08-01), Jacobus, Jr.
patent: 4525920 (1985-07-01), Jacobs et al.
patent: 4535532 (1985-08-01), Lancaster
patent: 4562638 (1986-01-01), Schwabe et al.
patent: 4569117 (1986-02-01), Baglee et al.
patent: 4590665 (1986-05-01), Owens et al.
patent: 4601098 (1986-07-01), Oda
IEEE Transactions on Electron Devices, vol. ED-20, No. 12, Dec. 1973, pp. 1129-1132, New York, U.S.; R. A. Moline et al.: "Self-Aligned Maskless Chan Stops for IGFET Integrated Circuits".

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