Device for testing a network of components, in particular an ele

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364482, 324615, G06F 1520, G01R 2700

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active

051827174

ABSTRACT:
Device for testing a network of components, in particular an electronic circuit.
The respective potential differences between the terminals of the circuit to be tested are acquired during a chosen time interval and stored in a values memory. A memory contains predetermined functional models of electronic components. The processing means, connected to these memories, are capable of effecting a processing comprising the estimation, during said time interval, of physical values, notably of current-expressions, taking account of expressions contained in said acquired models and values, and storing them in the values memory as well as tests on the values contained in the values memory.

REFERENCES:
patent: 4196475 (1980-04-01), Hall
patent: 4342089 (1982-07-01), Hall
patent: 4408157 (1983-10-01), Beaubin
patent: 4647846 (1987-03-01), Malkin
patent: 4652814 (1987-03-01), Groves et al.
patent: 4672555 (1987-06-01), Hart et al.
patent: 4796259 (1989-01-01), Troy
patent: 4815077 (1989-03-01), Boenning
"Integration of Test with Design and Manufacturing"; International Test Conference 1987 Proceedings; 1987 IEEE, pp. 586-594 French Search Report.

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