Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-09-06
1996-04-09
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324753, G01R 3100, G01R 1512
Patent
active
055065163
ABSTRACT:
In a method of inspecting an active matrix substrate of the invention, the active matrix substrate includes a pixel portion having a plurality of pixels arranged in a matrix, a plurality of scanning lines and data lines for driving the pixel portion, and a drive circuit having one and more video lines, one end of each of the plurality of data lines being connected to one of the video lines. The method of the invention includes the steps of: providing one or more inspecting lines, the other end of each of the plurality of data lines being connected to one of the inspecting lines; applying an inspecting signal to each of the inspecting lines, with the drive circuit being in operation; and inspecting the drive circuit and the plurality of data lines, based on at least one of the signals output from the or each of the video lines in accordance with the inspecting signals.
REFERENCES:
patent: 4841233 (1989-06-01), Yoshida
patent: 5113134 (1992-05-01), Plus et al.
patent: 5184082 (1993-02-01), Nelson
patent: 5235272 (1993-08-01), Henley
patent: 5262720 (1993-11-01), Senn et al.
patent: 5285150 (1994-02-01), Henley et al.
Matsushima Yasuhiro
Shimada Takayuki
Takafuji Yutaka
Yamashita Toshihiro
Bowser Barry C.
Sharp Kabushiki Kaisha
Wieder Kenneth A.
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