1981-10-09
1984-05-29
Atkinson, Charles E.
Excavating
364900, G01R 3128
Patent
active
044519184
ABSTRACT:
A continuous sequence of test data for testing LSI devices is provided selectably from one of a number of memory elements, each of which is reloaded, when not busy providing test data, from a higher capacity, lower speed storage element.
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Atkinson Charles E.
Teradyne, Inc.
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