Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1976-07-28
1978-02-07
Corbin, John K.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
358 87, 358106, G01N 2132
Patent
active
040724271
ABSTRACT:
A visual, fault inspection and fault location system for millimeter waveguide and the like comprises a cylinder of optically transparent material having a lens system mounted at one end thereof and a conical reflector at the other to permit the viewing of internal waveguide wall faults at right angles to the optical axis of the lens system. A video transmitter includes a camera tube positioned to receive images relayed by the lens system. The described optics assembly can be mounted on a self-propelled carrier, termed a "long distance mouse" because it travels through buried waveguide. An undistorted view of the interior wall of the waveguide is achieved by producing a polar scan in the camera tube and then displaying the resultant video signals at a remote receiver in accordance with a rectangular raster.
REFERENCES:
patent: 3320359 (1967-05-01), Ikegami
patent: 3413067 (1968-11-01), Froio
Heinz, "Method of Checking Wall Imperfections", Western Electric Technical Digest, No. 19, pp. 31-32, July 1970.
Warters, "Millimeter Waveguide Scores High in Field Test", Bell Laboratories Record, pp. 401-408, Nov. 1975.
Carlin et al., "Waveguide Transmission Measurements and Analysis" IEEE International Conf. On Comm., Conf. Record, vol. 1, pp. (11-14)-(11-23) June 1976.
Bell Telephone Laboratories Incorporated
Corbin John K.
Koren Matthew W.
Mullarney John K.
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