Voltage generating circuit for IC test

Details Voltage generating circuit for IC test Voltage generating circuit for IC test

1995-06-02

1997-01-14

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 3128

Patent

active

055943594

ABSTRACT:
A voltage generating circuit provides little fluctuation of voltage to an IC load when the dynamic character of the IC is tested. In order to achieve this aim, a resistance is inserted between a power supply line and a feedback circuit after the static character of the IC is tested, and a current supply is set to draw current from the connecting point of the inserted resistance. The current supply inversely decreases or increases the amount of current drawn based upon the increment or the decrement of load current which flows through the inserted resistance.

REFERENCES:
patent: 4716307 (1987-12-01), Aoyama
patent: 5063304 (1991-11-01), Iyengar
patent: 5097206 (1992-03-01), Perner
patent: 5111136 (1992-05-01), Kawashima
patent: 5349290 (1994-09-01), Yamada

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