Method of and apparatus for determining the position of a device

Details Method of and apparatus for determining the position of a device Method of and apparatus for determining the position of a device

1984-09-12

1986-04-29

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356372, G01B 1114, G01B 1100

Patent

active

045853495

ABSTRACT:
A method of and an apparatus for determining the location or position of a surface element with respect to a reference which utilizes polychromatic light and with a holographic lens on the light focuses individual wavelengths thereof to respective focal points at one of which the surface element can be located. Light reflected from this surface element is then decomposed into the respective wavelengths and the intensities of these wavelengths are analyzed to determine the wavelength of greatest intensity, this being the wavelength whose focus corresponds to the focus of the surface element. The maximum intensity wavelength is used to determine the position of this focus and hence the position of the surface element with respect to a reference.

REFERENCES:
patent: 3185021 (1965-05-01), Thompson
patent: 3664750 (1972-05-01), Hock
patent: 3794426 (1974-02-01), Mueller et al.

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