Method of making a semiconductor device having floating source a

Fishing – trapping – and vermin destroying

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437 56, 437 90, H01L 21265, H01L 2170, H01L 2700, H01L 2120

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055939287

ABSTRACT:
The present invention relates to a MOS transistor having floating source regions and floating drain regions.
An epitaxial layer is grown on the channel regions of a semiconductor substrate in such a manner that the surface of the epitaxial layer makes a plane together with the upper surface of field oxide films, thereby enabling steps to be reduced.
A polysilicon film is filled in recess regions formed by the growth of epitaxial layer and impurity-ions are implanted into the polysilicon film to form floating source regions and a floating drain regions.
A buried oxide film is formed such a manner that it encloses the polysilicon film filled in the recess regions to prevent the junction leakage and to improve the characteristic of insulation.

REFERENCES:
patent: 4820654 (1989-04-01), Lee
patent: 4910165 (1990-03-01), Lee et al.
patent: 5017998 (1991-05-01), Miura et al.
patent: 5040037 (1991-08-01), Yamaguchi et al.
patent: 5100830 (1992-03-01), Morita
patent: 5116768 (1992-05-01), Kawamura
patent: 5188973 (1993-02-01), Omura et al.
patent: 5191397 (1993-03-01), Yoshida
patent: 5266517 (1993-11-01), Smayling et al.

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