Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1995-12-18
1999-06-29
Ballato, Josie
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324671, 324662, G01R 2726
Patent
active
059173289
ABSTRACT:
Apparatus for inspecting the wall thickness of non-round containers includes capacitive sensors which cooperate with oscillator means to provide voltage signals corresponding to container wall thickness to electronic processors which convert the voltage signals to corresponding thickness values and compare them with the desired thickness values. The apparatus subjects the containers to translational movement through the inspection zone while resisting rotational movement. The sensors have at least one sensor element having capacitive sensor portions that are not in the same plane as other capacitive sensor elements or a single sensor element having portions in more than one plane. The sensor elements may be individual sensor elements which are each adapted to inspect different portions of a container or may, in another embodiment, be a single sensor element. The sensors are adapted to be movably mounted so as to maintain efficient contact with non-round containers during inspection. Among the types of containers which may be inspected by the apparatus are generally rectangular and generally oval containers. A corresponding method is provided.
REFERENCES:
patent: 2573824 (1951-11-01), Baker
patent: 3348313 (1967-10-01), Urmenyi
patent: 4077254 (1978-03-01), Mercer et al.
patent: 4124112 (1978-11-01), Mohney et al.
patent: 4422035 (1983-12-01), Risko
patent: 4820972 (1989-04-01), Scott et al.
patent: 4862062 (1989-08-01), Baker et al.
patent: 4870342 (1989-09-01), Scott
patent: 4930364 (1990-06-01), Baker et al.
patent: 4965523 (1990-10-01), Baker et al.
patent: 4972566 (1990-11-01), Andersen et al.
patent: 4996658 (1991-02-01), Baker
patent: 5097216 (1992-03-01), Dimmick, Sr. et al.
patent: 5121068 (1992-06-01), Baker
patent: 5604442 (1997-02-01), Dimmick
patent: 5723797 (1998-03-01), Dimmick
Dimmick Henry M.
Kisiel Joseph L.
Shetter Jerrold K.
AGR International, Inc.
Ballato Josie
Silverman Arnold B.
Valone Thomas
LandOfFree
Container inspection apparatus for determining the wall thicknes does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Container inspection apparatus for determining the wall thicknes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Container inspection apparatus for determining the wall thicknes will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1378431