Method of determining the monitor sensitivity of, and method and

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Radiation beam modification of or by storage medium

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Details

369100, 369122, 369106, G11B 700, G11B 785

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active

050671227

ABSTRACT:
A method is described which enables automatic determination of the monitor sensitivity of a radiation emitting arrangement (in particular a laser diode and photodiode arrangement), which monitor sensitivity relates a level of a monitor signal (I.sub.M) generated by the arrangement to a corresponding optical output level (O.sub.L) of the arrangement. The method comprises the steps of: (i) supplying a varying drive signal (I.sub.L1,I.sub.L2) to the arrangement and measuring the rate of change (.DELTA.I.sub.M /.DELTA.I.sub.L) of the monitor signal (I.sub.M) with respect to the supplied drive signal (I.sub.L); and (ii) combining the measured rate of change with an assumed differential efficiency (k) of the arrangement to determine the monitor sensitivity (O.sub.L /I.sub.M) of the arrangement. The provision of a control system able to implement such a method eliminates the need for a factory adjustment in the manufacture of apparatus such as optical recording and/or reproducing apparatus.

REFERENCES:
patent: 4785443 (1988-11-01), Minami et al.

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