Semiconductor device having semiconductor-on-insulator structure

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 2, 357 4, 357 2345, H01L 2978

Patent

active

050669931

ABSTRACT:
A method of producing a semiconductor-on-insulator structure generates a first fixed charge in an insulator layer of a base substrate. An active substrate which is made of a semiconductor is bonded on the insulator layer of the base substrate to thereby generate a second fixed charge at an interface of the insulator layer and the active substrate. The first and second fixed charges have mutually opposite polarities. A portion of the active substrate is removed to form the active substrate to an arbitrary thickness.

REFERENCES:
patent: 4297782 (1981-11-01), Ito
patent: 4758529 (1988-07-01), Ipri
patent: 4778773 (1988-10-01), Sukegawa
patent: 4788157 (1988-11-01), Nakamura
patent: 4810664 (1989-03-01), Kamins et al.
patent: 4864377 (1989-09-01), Widdershoven
patent: 4880753 (1989-11-01), Meakin et al.
Wang et al., "The Effect of Ion Implantation on Oxide Charge in MOS Devices", IEEE Transactions on Nuclear Science, vol. NS-22, No. 6, Dec. 1975 Merely Relates to Studies on Electron Traps Introduced into the Oxide by Implantation of Al+ions.
Curtis, Jr., et al., "Physical Mechanisms of Radiation Hardening of MOS Devices by Ion Implantation", IEEE Transactions on Nuclear Science, vol. NS-22, No. 6, Dec. 1975 Simply Relates to Studies on Al+Ion-Implanted MOS Capacitors.
DiMaria et al., "Location of Trapped Charge in Aluminium-Implanted SiO.sub.2 ", IBM J. Res. Develop. vol. 22, No. 3, May 1978.
Young et al., "Characterization of Electron Traps in Aluminum-Implanted SiO.sub.2 ", IBM J. Res. Develop. vol. 22, No. 3, May 1978 Merely Relate to Studies on Electron Trapping Behavior of SiO.sub.2 Implanted with Al.
Lasky et al., "Silicon-On-Insulator (SOI) by Bonding and Etch-Back", IEDM 85, pp. 684-687 1985.
Hamaguchi et al., "Novel LSI/SOI Wafer Fabrication Using Device Layer Transfer Technique", IEDM 85, pp. 688-691 1985 Simply Relate to Studies on SOI Structions.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device having semiconductor-on-insulator structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having semiconductor-on-insulator structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having semiconductor-on-insulator structure will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1373645

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.