Integrated circuits with reduced switching noise

Details Integrated circuits with reduced switching noise Integrated circuits with reduced switching noise

1989-12-04

1991-11-19

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307263, 3072968, 307572, 307542, H03K 1716, H03K 512, H03K 19003

Patent

active

050668730

ABSTRACT:
A new slew rate controlled output buffer with built-in temperature and voltage compensation for integrated circuits is designed to reduce VCC/VSS switching noise encountered in high speed, high current drive integrated circuit applications.

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patent: 4857770 (1989-08-01), Partovi et al.
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patent: 4894561 (1990-01-01), Nogami
IBM Technical Disclosure Bulletin, vol. 32, No. 4A Sep. 1989, p. 18.
N. H. E. Weste et al., Principles of CMOS VLSI Design, Addison-Wesley Publishing Company, Reading, Mass., 1985, pp. 39-42.
S. Cheng et al., "Effects of Operating Temperature on Electrical Parameters in an Analog Process," IEEE Circuits and Devices Magazine, Jul. 1989, pp. 31-38.
W. J. Scarpero, "Field-Effect Transistor Bidirectional Driver Control Circuit," IBM Technical Disclosure Bulletin, vol. 16, No. 8, Jan. 1974, pp. 2442-2443.

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