System and method for measuring elliptical elements

Details System and method for measuring elliptical elements System and method for measuring elliptical elements

1987-06-10

1989-02-14

Lall, Parshotam S.

Boots, shoes, and leggings

358107, 356384, H04N 718

Patent

active

048051241

ABSTRACT:
The major/minor dimensions of elliptical elements are measured by simultaneously scanning both dimensions of the elements and arranging the data in a matrix for each of the dimensions. A first preselected number of the largest elements are arranged or averaged for one dimension to obtain an average for one of the dimensions. A second predetermined number of largest elements are averaged for the other dimension to obtain an average for the other dimension. The measured dimensions are compared with upper and lower limits to verify the acceptability of the dimensions.

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