Optics: measuring and testing – For optical fiber or waveguide inspection
Patent
1995-04-21
1996-02-20
McGraw, Vincent P.
Optics: measuring and testing
For optical fiber or waveguide inspection
G01N 2184
Patent
active
054934060
ABSTRACT:
This invention relates to an optical fiber component characteristics measuring device which can measure with high precision for a short period of time characteristics of the optical fiber component. The optical fiber component characteristics measuring device comprises a plurality of light sources for emitting light of set different wavelengths, optical coupling means for mixing light from the light sources, coupling means for supplying mixed light from the optical coupling means to an optical fiber component to be measured, spectroscoping means for spectroscoping light from the optical fiber component to be measured, and photoelectric means for parallelly detecting spectra of the light of the respective wavelengths outputted by the spectroscoping means and for converting the spectra into electric signals corresponding to the respective wavelengths. On the input side of the spectroscoping means there is provided optical switch means for switching sequentially between that of light outputted from the plurality of output optical fibers of the optical fiber component to be measured, which has one of said different wavelengths. The light from the optical switch means is detected by the spectroscoping means, whereby characteristics of the optical fiber component including a plurality of output optical fibers can be measured.
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Patent Abstracts of Japan, vol. 9, No. 210 (P-383) (1933) 28 Aug. 1985 & JP-A-60 070 335 (Nippon Denshin Denkwa Kosha) 22 Apr. 1985 *abstract*.
Freyhardt et al., "Prinzipien Und Anwendungsbeispiele Der Optischen Messtechnik", Nachrichtentechnische Berichte, No. 3, Dec. 1986, Backnang de, p. 62.
J. Thomas Brownrigg, "Performance of a Miniature Diode-Array Spectrometer", American Holographic, Inc., Spectroscopy, vol. 6, No. 2, publication date Feb. 1991.
Koishi Musubu
Sawaki Akihiro
Hamamatsu Photonics K.K.
McGraw Vincent P.
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